Capable of 32 DUTs in Parallel Testing for 10-12 bit LCD Driver ICs
Global demand for LCD driver ICs is growing in response to an expected skyrocketing in popularity for LCD televisions, as well as liquid crystal panels for cellular phones with increasingly rich feature sets. Tracking these developments, LCD driver ICs are also growing in both pin count and functionality. This evolution, however, has added to the importance of keeping production costs low. The T6373 LCD driver test system offers an optimal solution for customers facing this paradox.
Reducing Cost of Test for LCD Drivers with Large Pin Counts
The T6373 can be equipped with a maximum of 3,072 LCD channels and 512 I/O channels. It supports four-device parallel test for 640-pin and 720-pin driver ICs, which will dominate in the future. For driver ICs with BIST circuits, it could support up to 32 driver ICs.
Support for the Newest Driver ICs
The T6373's high-speed/precision digitizer and DC (LCD ch) test unit are configured for per-pin operation. When testing many-pin/precision (10 bit/1024 gradation) driver ICs, this tester boasts throughput of up to 150% greater than that of its predecessor.
Improved Support for Leveraging Legacy (T6372) Assets
By offering legacy support for the well-established ViewpointR test software, the T6373 allows the customer to use valuable test assets, such as test program environments, test boards, and probe cards, that supported its predecessor model.
Major Specifications
| Target devices | LCD source/gate driver ICs, single-chip controller driver ICs, MCUs, and MPUs |
|---|---|
| Simultaneous testing | Maximum 32 devices (software parallel test and odd-numbers of devices supported) |
| LCD measurement | 3,072 channels (maximum), per-pin digitizer and per-pin DC section |
| Reference voltage source (RVS) | ±32 V (maximum 160 channels) |
| Digital measurement section |
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