Rohde-schwarz- Test System Versatile Platform (Model:R&S®CompactTSVP)

• Comprehensive system approach:
  • System oriented, compact basic unit and modular instruments for DC-, LF- und RF- signals from own production
  • Floating stimulus und measurement technology
  • Optimized signal concept (analog measurement bus, Rear I/O concept)
  • Conceptual solutions to handle high voltages and currents
  • Integration of DUT supply modules and loads
  • Integrated adaptation concept for DUTs
  • System technology allows combination of functional and in-circuit test
  • Wide range of functionality in a compact system design, ideal for in-line applications
• High test speed (by „intelligent“ modules)
• Standardized and powerful software modules (GTSL, EGTSL) with simulation and tracing possibilities
• Support of the operating system Microsoft Windows XP™
• Integration of cPCI/PXI-Modules from the market without modifiation
• Integrated selftest secures readiness of system use and allows detailed diagnostics in case of system fault
• On site calibration possible

The R&S^®CompactTSVP family of products is an open test platform based on CompactPCI and PXI and has been developed for high-performance ATE applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions.

The R&S^®CompactTSVP is offered as a test and measurement platform (R&S^®TS-PCA3) and as a switching application platform (R&S^®TS-PWA3). Various measurement modules for industrial use in research, development and production are available.