Signal Recovery- Gated Integrator (Model:4121 B)

Overview

This module is an ideal component for building boxcar averager systems. It includes a wide bandwidth variable gain AC/DC coupled input amplifier with offset adjustment and a high speed sampling gate with variable width and delay controls. It operates in normal or baseline sampling mode and features a switch-selected choice of how many samples are included in the averaging process. Separate outputs for the average and last sample taken are also provided. A gate monitor supplies a synchronized gate output pulse for application to an oscilloscope trigger or for referencing associated processing electronics. Trigger input is ECl or TTL or can be derived from the module's own adjustable trigger generator.

The module is packaged in a 2-unit wide NIM format and as such requires a suitable NIM rack and power supply to operate. The simplest single-channel system can therefore be produced with one model 4121 B module and a suitable NIM rack and power supply (such as the SIGIVAL RECOVERY model 4006 or 4001A14002D. The addition of a second model4121B and a model 4161A Display/ADC and control module provides a dual channel system with the added capability of allowing the transfer of output data to a computer for external analysis. Further modules can be added to increase the overall number of channels.

The unit can also be used with other SIGIVAL RECOVERY instruments, such as our lock-in amplifiers, to build systems capable of swept-gate waveform recovery experiments, all controlled via the Acquire data acquisition software.

• 1 ns minimum gate width
• 80 kHz max trigger rate 
• Linear or Exponential averaging 
• Input offset control 
• Normal or Baselilne sampling modes
• Built-in trigger generator 
• Pulsed laser experiments
• Phosphorescence decay time studies
• Precison signal sampling

Specifications

<>General
Single-channel gated integrator module mounted in NIM enclosure with adjustable sensitivity, offset, gatewidth and output averager.  Manual controls.

Measurement Modes
On receipt of an external trigger, the instrument waits for the preset gate delay and then integrates the voltage present at its input for the preset gate width.  On completion a DC voltage representing this integral is provided at the Last Sample Output connector and in addition fed forward into an analog integrator state. 
Single-channel gated integrator module mounted in NIM enclosure with adjustable sensitivity, offset, gatewidth and output averager.  Manual controls.Analog gate delay generator with manual or DC voltage control.On receipt of an external trigger, the instrument waits for the preset gate delay and then integrates the voltage present at its input for the preset gate width.  On completion a DC voltage representing this integral is provided at the Last Sample Output connector and in addition fed forward into an analog integrator state.  Single-channel gated integrator module mounted in NIM enclosure with adjustable sensitivity, offset, gatewidth and output averager.  Manual controls.Analog gate delay generator with manual or DC voltage control.On receipt of an external trigger, the instrument waits for the preset gate delay and then integrates the voltage present at its input for the preset gate width.  On completion a DC voltage representing this integral is provided at the Last Sample Output connector and in addition fed forward into an analog integrator state.  Single-channel gated integrator module mounted in NIM enclosure with adjustable sensitivity, offset, gatewidth and output averager.  Manual controls.Analog gate delay generator with manual or DC voltage control.On receipt of an external trigger, the instrument waits for the preset gate delay and then integrates the voltage present at its input for the preset gate width.  On completion a DC voltage representing this integral is provided at the Last Sample Output connector and in addition fed forward into an analog integrator state.